COYEUX Microscope Sample Flattening Device, Metallographic Specimens Press Machine, Slicing Analysis, Flattening Accuracy ≤ 0.5mm, Flat Surface, for Various Laboratory Flattened Specimens

Specifications: A: Product name: Direct pressure flatter Main material: cast iron Upper gland size: 50MM Lower pressure gland size: 95MM Flattening accuracy: ≤0.5MM Product net weight: 1KG Upper and lower pressure glands, finale materials: stainless steel, aluminum alloy Appearance size: width * depth * height = 120MM * 110MM * 220MM B: Product name: Lever leveling device Main material: carbon steel Upper gland size: 89MM Lower pressure gland size: 89MM Flattening accuracy: ≤0.5MM Product net weight: 3KG Appearance size: width * depth * height = 120MM * 153MM * 310MM Product List: Flattener*1

• ★ High-precision flattening: It has excellent flattening accuracy, with a flattening accuracy of ≤0.5mm, which can meet various requirements for precision metallographic analysis. Flat surface, improve working efficiency, and optimize material
• ★ Working principle: Through the principle that the plane on the workbench is parallel to the plane under the leveling device, the sample that needs to be leveled is fixed to the workbench with plasticine or universal clamps, and press the handle to correct the plane under the reference flat plate under the leveling device downward, so that it is parallel to the workbench
• ★ Slice flattener: an auxiliary device for metallographic analysis tests, mainly used to calibrate the sample perpendicular to the optical axis of a microscope or hardness meter, ensuring the upper and lower planes of the sample are parallel to improve the accuracy and stability of experiments and measurements.
• ★ Easy to operate: simple and compact structure, easy to use. Just fix the sample and press the handle to complete the flattening operation without complicated debugging and training
• ★ Wide application: suitable for electronics/batteries, steel/metals, aerospace, automobiles and parts and other fields. Metallographic samples of various materials can be flattened